NOC:Techniques of Material Characterization

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Media Storage Type : 32 GB USB Stick

NPTEL Subject Matter Expert : Prof. Shibayan Roy

NPTEL Co-ordinating Institute : IIT Kharagpur

NPTEL Lecture Count : 60

NPTEL Course Size : 9.0 GB

NPTEL PDF Text Transcription : Available and Included

NPTEL Subtitle Transcription : Available and Included (SRT)


Lecture Titles:

Lecture 1 - Introduction to the course and basic principles of image formation
Lecture 2 - Image formation, resolution, magnification, depth of field and depth of focus
Lecture 3 - Aberrations in microscopy: General concepts
Lecture 4 - Introduction, types and image formation in Optical microscopy
Lecture 5 - Components of optical microscope
Lecture 6 - Bright field and Dark field modes
Lecture 7 - Phase contrast optical microscopy
Lecture 8 - Polarized light microscopy
Lecture 9 - Differential interference contrast
Lecture 10 - Fluorescence microscopy
Lecture 11 - Basic components of electron microscope
Lecture 12 - Basic components of electron microscope (Continued...)
Lecture 13 - Basic components of electron microscope (Continued...)
Lecture 14 - Electron-material interaction
Lecture 15 - Electron-material interaction (Continued...)
Lecture 16 - Electron-material interaction (Continued...) and Image formation and contrast generation
Lecture 17 - Modes of TEM (BF and DF)
Lecture 18 - Modes of TEM
Lecture 19 - Modes of TEM (Continued...) and Electron diffraction in TEM
Lecture 20 - Electron diffraction in TEM
Lecture 21 - Electron diffraction in TEM (Continued...)
Lecture 22 - Electron diffraction in TEM (Continued...)
Lecture 23 - Electron diffraction in TEM (Continued...)
Lecture 24 - Electron diffraction in TEM (Continued...)
Lecture 25 - Application of Electron diffraction
Lecture 26 - Signal generation in SEM
Lecture 27 - Signal generation in SEM (Continued...)
Lecture 28 - Signal generation in SEM (Continued...)
Lecture 29 - Signal generation in SEM (Continued...)
Lecture 30 - Signal generation in SEM (Continued...)
Lecture 31 - Basic components of SEM
Lecture 32 - Basic components of SEM (Continued...)
Lecture 33 - Optics of SEM
Lecture 34 - Optics of SEM (Continued...)
Lecture 35 - Optics of SEM (Continued...) and analytical detectors
Lecture 36 - Analytical detectors in SEM
Lecture 37 - Analytical (WDS) detector and contrast formation in SEM
Lecture 38 - Imaging in SEM
Lecture 39 - Imaging in SEM (Continued...)
Lecture 40 - Imaging in SEM (Continued...)
Lecture 41 - Imaging in SEM and X-ray diffraction
Lecture 42 - Continuous and characteristics X-ray spectrum
Lecture 43 - Characteristics X-ray radiation
Lecture 44 - Characteristics X-ray radiation (Continued...) and X-ray absorption
Lecture 45 - X-ray absorption (Continued...)
Lecture 46 - X-ray absorption and filters
Lecture 47 - Intensity of diffracted beam
Lecture 48 - Intensity of diffracted beam (Continued...)
Lecture 49 - Intensity of diffracted beam (Continued...)
Lecture 50 - Intensity of diffracted beam (Continued...)
Lecture 51 - Intensity of diffracted beam (Continued...)
Lecture 52 - Intensity of diffracted beam (Continued...)
Lecture 53 - Intensity of diffracted beam (Continued...)
Lecture 54 - Intensity of diffracted beam (Continued...)
Lecture 55 - Intensity of diffracted beam (Continued...)
Lecture 56 - Intensity of diffracted beam (Continued...) and X-ray diffraction profile and analysis
Lecture 57 - X-ray diffraction profile and analysis
Lecture 58 - X-ray diffraction profile and analysis (Continued...)
Lecture 59 - X-ray diffraction profile and analysis (Continued...)
Lecture 60 - Electron backscatter diffraction (EBSD)

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