NOC:Scanning Electron/Ion/Probe Microscopy in Materials Characterization

Media Storage Type : 32 GB USB Stick

NPTEL Subject Matter Expert : Prof. Debabrata Pradhan

NPTEL Co-ordinating Institute : IIT Kharagpur

NPTEL Lecture Count : 43

NPTEL Course Size : 4.9 GB

NPTEL PDF Text Transcription : Available and Included

NPTEL Subtitle Transcription : Available and Included (SRT)

Lecture Titles:

Lecture 1 - Introduction to Microscopy
Lecture 2 - Scanning Electron Microscopy
Lecture 3 - SEM and Its Capabilities
Lecture 4 - Main Components of SEM - Electron Guns
Lecture 5 - Main Components of SEM - Electron Guns and Electromagnetic Lenses
Lecture 6 - Electron Probe Diameter Verses Electron Probe Current
Lecture 7 - Electron Beam - Specimen Interaction
Lecture 8 - Detectors
Lecture 9 - BSE Detector and Sample Preparation for SEM
Lecture 10 - Parameters Need to be Considered to obtain a Good SEM Image
Lecture 11 - How to Get a Good SEM Image
Lecture 12 - Additional Capabilities of SEM
Lecture 13 - Additional Capabilities of SEM (Continued...)
Lecture 14 - Additional Capabilities of SEM (Continued...)
Lecture 15 - Scanning Ion Microscopy - An Introduction
Lecture 16 - Ions Versus Electrons as Source for Microscopy
Lecture 17 - Ions Source in HIM
Lecture 18 - GFIS Properties and Ion Optical Column
Lecture 19 - Ion Optical Column
Lecture 20 - Ion-Solid Interactions and Signal Generation
Lecture 21 - Signal Generation and Contrast Mechanism
Lecture 22 - Contrast Mechanism and Imaging Modes
Lecture 23 - Scanning Transmission Ion Microscopy and Microanalysis with HIM
Lecture 24 - Creation and Modification of Materials by HIM
Lecture 25 - Introduction to Scanning Probe Microscopy
Lecture 26 - STM Instrumentation
Lecture 27 - Main Components of STM
Lecture 28 - Main Components of STM (Continued...)
Lecture 29 - Main Components of STM (Continued...)
Lecture 30 - Working Principle of STM
Lecture 31 - Operating Modes
Lecture 32 - Scanning Tunneling Spectroscopy
Lecture 33 - SPM - Atomic Force Microscopy (AFM)
Lecture 34 - Force Between Tip and Sample in AFM
Lecture 35 - Atomic Force Microscope - Parts
Lecture 36 - Modes of AFM Operation
Lecture 37 - Modes of AFM Operation (Continued...)
Lecture 38 - AFM Imaging
Lecture 39 - Phase Imaging, Noises and Resolution
Lecture 40 - Surface Properties Measurements using Other Forces
Lecture 41 - Surface Properties Measurements using AFM
Lecture 42 - Manipulation of Atoms, Molecules and Industrial Applications
Lecture 43 - Summary