NOC:Embedded Systems-Design Verification and Test (USB)
Media Storage Type : 32 GB USB Stick
NPTEL Subject Matter Expert : Prof.Jatindra Kumar Deka, Dr. Santosh Biswas, Prof.Arnab Sarkar
NPTEL Co-ordinating Institute : IIT Guwahati
NPTEL Lecture Count : 37
NPTEL Course Size : 14 GB
NPTEL PDF Text Transcription : Available and Included
NPTEL Subtitle Transcription : Not Available
Lecture Titles:
Lecture 1 - Introduction
Lecture 2 - Modeling Techniques - 1
Lecture 3 - Modeling Techniques - 2
Lecture 4 - Hardware/Software Partitioning - 1
Lecture 5 - Hardware/Software Partitioning - 2
Lecture 6 - Introduction to Hardware Design
Lecture 7 - Hardware Architectural Synthesis - 1
Lecture 8 - Hardware Architectural Synthesis - 2
Lecture 9 - Hardware Architectural Synthesis - 3
Lecture 10 - Hardware Architectural Synthesis - 4
Lecture 11 - Hardware Architectural Synthesis - 5
Lecture 12 - Hardware Architectural Synthesis - 6
Lecture 13 - Hardware Architectural Synthesis - 7
Lecture 14 - System Level Analysis
Lecture 15 - Uniprocessor Scheduling - 1
Lecture 16 - Uniprocessor Scheduling - 2
Lecture 17 - Multiprocessor Scheduling - 1
Lecture 18 - Multiprocessor Scheduling - 2
Lecture 19 - Introduction and Basic Operators of Temporal Logic
Lecture 20 - Syntax and Semantics of CTL
Lecture 21 - Equivalence between CTL formulas
Lecture 22 - Model Checking Algorithm
Lecture 23 - Binary Decision Diagram
Lecture 24 - Use of OBDDs for State Transition System
Lecture 25 - Symbolic Model Checking
Lecture 26 - Introduction to Digital VLSI Testing
Lecture 27 - Automatic Test Pattern Generation (ATPG)
Lecture 28 - Scan Chain based Sequential Circuit Testing
Lecture 29 - Software-Hardware Co-validation Fault Models and High Level Testing for Complex Embedded Systems""
Lecture 30 - Testing for embedded cores
Lecture 31 - Bus and Memory Testing
Lecture 32 - Testing for advanced faults in Real time Embedded Systems
Lecture 33 - BIST for Embedded Systems
Lecture 34 - Concurrent Testing for Fault tolerant Embedded Systems - 1
Lecture 35 - Concurrent Testing for Fault tolerant Embedded Systems - 2
Lecture 36 - Testing for Re-programmable hardware
Lecture 37 - Interaction Testing between Hardware and Software