NOC:Digital VLSI Testing (USB)

Special Price ₹760.00 Regular Price ₹950.00
In stock
SKU
117105137



Media Storage Type : 32 GB USB Stick

NPTEL Subject Matter Expert : Prof. Santanu Chattopadhyay

NPTEL Co-ordinating Institute : IIT Kharagpur

NPTEL Lecture Count : 60

NPTEL Course Size : 14 GB

NPTEL PDF Text Transcription : Available and Included

NPTEL Subtitle Transcription : Available and Included (SRT)


Lecture Titles:

Lecture 1 - Introduction
Lecture 2 - Introduction (Continued...)
Lecture 3 - Introduction (Continued...)
Lecture 4 - Introduction (Continued...)
Lecture 5 - DFT
Lecture 6 - DFT (Continued...)
Lecture 7 - DFT (Continued...)
Lecture 8 - DFT (Continued...)
Lecture 9 - DFT (Continued...)
Lecture 10 - DFT (Continued...)
Lecture 11 - Logic and Fault Simulation
Lecture 12 - Logic and Fault Simulation (Continued...)
Lecture 13 - Logic and Fault Simulation (Continued...)
Lecture 14 - Logic and Fault Simulation (Continued...)
Lecture 15 - Logic and Fault Simulation (Continued...)
Lecture 16 - Logic and Fault Simulation (Continued...)
Lecture 17 - Test Generation
Lecture 18 - Test Generation (Continued...)
Lecture 19 - Test Generation (Continued...)
Lecture 20 - Test Generation (Continued...)
Lecture 21 - Test Generation (Continued...)
Lecture 22 - Test Generation (Continued...)
Lecture 23 - Test Generation (Continued...)
Lecture 24 - Logic BIST
Lecture 25 - Logic BIST (Continued...)
Lecture 26 - Logic BIST (Continued...)
Lecture 27 - Logic BIST (Continued...)
Lecture 28 - Test Compression
Lecture 29 - Test Compression (Continued...)
Lecture 30 - Test Compression (Continued...)
Lecture 31 - Test Compression (Continued...)
Lecture 32 - Low Power Testing
Lecture 33 - Low Power Testing (Continued...)
Lecture 34 - Low Power Testing (Continued...)
Lecture 35 - Low Power Testing (Continued...)
Lecture 36 - Low Power Testing (Continued...)
Lecture 37 - Thermal Aware Testing
Lecture 38 - Thermal Aware Testing (Continued...)
Lecture 39 - Thermal Aware Testing (Continued...)
Lecture 40 - Boundary Scan
Lecture 41 - Boundary Scan (Continued...)
Lecture 42 - Boundary Scan (Continued...)
Lecture 43 - Boundary Scan (Continued...)
Lecture 44 - Boundary Scan (Continued...)
Lecture 45 - System/Network - On - Chip Test
Lecture 46 - System/Network - On - Chip Test (Continued...)
Lecture 47 - System/Network - On - Chip Test (Continued...)
Lecture 48 - System/Network - On - Chip Test (Continued...)
Lecture 49 - System/Network - On - Chip Test (Continued...)
Lecture 50 - System/Network - On - Chip Test (Continued...)
Lecture 51 - System/Network - On - Chip Test (Continued...)
Lecture 52 - System/Network - On - Chip Test (Continued...)
Lecture 53 - System/Network - On - Chip Test (Continued...)
Lecture 54 - System/Network - On - Chip Test (Continued...)
Lecture 55 - System/Network - On - Chip Test (Continued...)
Lecture 56 - System/Network - On - Chip Test (Continued...)
Lecture 57 - Memory Testing
Lecture 58 - Memory Testing (Continued...)
Lecture 59 - Memory Testing (Continued...)
Lecture 60 - Memory Testing (Continued...)

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