Materials Characterization (USB)

Special Price ₹1,000.00 Regular Price ₹1,250.00
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SKU
113106034



Media Storage Type : 64 GB USB Stick

NPTEL Subject Matter Expert : Dr. S. Sankaran

NPTEL Co-ordinating Institute : IIT Madras

NPTEL Lecture Count : 54

NPTEL Course Size : 30 GB

NPTEL PDF Text Transcription : Available and Included

NPTEL Subtitle Transcription : Available and Included (SRT)


Lecture Titles:

Lecture 1 - Properties of light, Image formation
Lecture 2 - Magnification and resolution
Lecture 3 - Depth of field,focus and field of view
Lecture 4 - Lens defects,filters and light microscopy introduction
Lecture 5 - Optical microscope demo., Bright field imaging, opaque specimen illumination
Lecture 6 - Opaque stop microscopy, Phase contrast microscopy
Lecture 7 - Dark field microscopy, Polarization microscopy
Lecture 8 - Differential interference contrast and fluorescence microscopy
Lecture 9 - Sample preparation techniques for optical microscopy
Lecture 10A - Tutorial problems (Continuation...)
Lecture 10 - Tutorial problems
Lecture 11 - Introduction to scanning electron Microscopy
Lecture 12 - Lens aberrations, Object resolution, Image quality
Lecture 13 - Interaction between electrons and sample, Imaging capabilities, Structural analysis, Elemental analysis
Lecture 14 - SEM and its mode of operation, Effect of aperture size,Working distance,condenser lens strength
Lecture 15 - SEM and its mode of operation- continuation, Relation between probe current and probe diameter, Summary
Lecture 16 - Factors affecting Interaction volume, Demonstration of SEM
Lecture 17 - Image formation and interpretation
Lecture 18 - Image formation and interpretation continued, EDS, WDS
Lecture 19 - Special contrast mechanisms, Monte Carlo simulations of Interaction volume
Lecture 20 - Electron channeling contrast imaging (ECCI), Electron back scattered diffraction(EBSD)-Theory & instrument demonstration
Lecture 21 - Tutorial Problems on SEM
Lecture 22 - Basics of X-ray emission from source, electron excitation and X-ray interaction with materials in general
Lecture 23 - Properties of X-rays
Lecture 24 - Bragg's Law Derivation
Lecture 25 - Diffraction relationship with reciprocal space
Lecture 26 - X-ray scattering
Lecture 27 - Factors affecting intensities of X-ray peaks
Lecture 28 - Factors affecting intensities of X-ray peaks- continuation
Lecture 29 - Effect of crystallite size and strain on intensity of X-rays
Lecture 30 - Profile fit, Factors affecting peak brodening
Lecture 31 - Indexing of diffraction pattern, Quantitative analysis
Lecture 32 - Indexing, Quantitative analysis-continuation, Residual stress measurements
Lecture 33 - XRD and Residual stress measurement- lab demonstration
Lecture 34 - Introduction to Transmission Electron Microscopy (TEM)
Lecture 35 - Fundementals of Transmission Electron Microscopy (TEM)
Lecture 36 - Basics of Diffraction-1
Lecture 37 - Basics of Diffraction-2
Lecture 38 - TEM imaging-1
Lecture 39 - TEM imaging-2
Lecture 40 - TEM instrument demonstration
Lecture 41 - TEM sample preparation-1
Lecture 42 - TEM sample preparation-2
Lecture 43 - XRD Tutorial - 1
Lecture 44 - XRD tutorial - 2
Lecture 45 - TEM Tutorial - 1
Lecture 46 - TEM Tutorial - 2
Lecture 47 - Quantitative metallography - Tutorial 1
Lecture 48 - Quantitative metallography - Tutorial 2
Lecture 49 - Quantitative metallography - Tutorial 3
Lecture 50 - Quantitative metallography - Tutorial 4
Lecture 51 - Quantitative metallography - Tutorial 5
Lecture 52 - Quantitative metallography - Tutorial 6
Lecture 53 - Quantitative metallography - Tutorial 7

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