Media Storage Type : DVD-ROM
NPTEL Course Name : Characterization of Materials
NPTEL Subject Matter Expert : Dr. A. Perumal
NPTEL Co-ordinating Institute : IIT Guwahati
NPTEL Lecture Count : 40
Lecture Titles:
Lecture 1 - Indroduction
Lecture 2 - X-ray diffraction and structural analysis
Lecture 3 - Powder diffraction
Lecture 4 - Calculation of average crystallite size
Lecture 5 - Additional Contribution for peak broadening
Lecture 6 - Neutron diffraction
Lecture 7 - Low-energy electron diffraction
Lecture 8 - Reflection high-energy electron diffraction
Lecture 9 - Introduction to microscopes
Lecture 10 - Light Microscope
Lecture 11 - Electron Microscope
Lecture 12 - Basics and Principles
Lecture 13 - TEM: Specimen Preparation
Lecture 14 - TEM: Imaging Modes - I
Lecture 15 - TEM: Imaging Modes - II
Lecture 16 - TEM: Electron Energy Loss Spectroscopy (EELS)
Lecture 17 - Scanning Electron Microscope
Lecture 18 - Rutherford Back Scattering (RBS)
Lecture 19 - Atomic Force Microscope
Lecture 20 - Scanning Probe Microscopy (SPM)
Lecture 21 - Introduction
Lecture 22 - Differential Scanning Calorimetry
Lecture 23 - Thermogravimetric analysis
Lecture 24 - Introduction II
Lecture 25 - Four-probe method
Lecture 26 - Hall effect
Lecture 27 - Effect of magnetic field on the electrical properties
Lecture 28 - Introduction III
Lecture 29 - Measuring Magnetization by Induction Method
Lecture 30 - Vibrating Sample Magnetometer (VSM)
Lecture 31 - AC susceptibility technique
Lecture 32 - Types of Measurements Using Magnetometers
Lecture 33 - Types of Measurements Using AC susceptibility
Lecture 34 - MOKE microscope
Lecture 35 - Nuclear Magnetic Resonance Spectroscopy
Lecture 36 - Electron Spin Resonance Spectroscopy
Lecture 37 - Introduction IV
Lecture 38 - Fourier Transform Infrared (FT-IR) Spectroscopy
Lecture 39 - Raman Spectroscopy
Lecture 40 - X-ray photoelectron spectroscopy