NPTEL : Materials Characterization (Metallurgy and Material Science)

Co-ordinators : Dr. S. Sankaran


Lecture 1 - Properties of light, Image formation

Lecture 2 - Magnification and resolution

Lecture 3 - Depth of field,focus and field of view

Lecture 4 - Lens defects,filters and light microscopy introduction

Lecture 5 - Optical microscope demo., Bright field imaging, opaque specimen illumination

Lecture 6 - Opaque stop microscopy, Phase contrast microscopy

Lecture 7 - Dark field microscopy, Polarization microscopy

Lecture 8 - Differential interference contrast and fluorescence microscopy

Lecture 9 - Sample preparation techniques for optical microscopy

Lecture 10A - Tutorial problems (Continuation...)

Lecture 10 - Tutorial problems

Lecture 11 - Introduction to scanning electron Microscopy

Lecture 12 - Lens aberrations, Object resolution, Image quality

Lecture 13 - Interaction between electrons and sample, Imaging capabilities, Structural analysis, Elemental analysis

Lecture 14 - SEM and its mode of operation, Effect of aperture size,Working distance,condenser lens strength

Lecture 15 - SEM and its mode of operation- continuation, Relation between probe current and probe diameter, Summary

Lecture 16 - Factors affecting Interaction volume, Demonstration of SEM

Lecture 17 - Image formation and interpretation

Lecture 18 - Image formation and interpretation continued, EDS, WDS

Lecture 19 - Special contrast mechanisms, Monte Carlo simulations of Interaction volume

Lecture 20 - Electron channeling contrast imaging (ECCI), Electron back scattered diffraction(EBSD)-Theory & instrument demonstration

Lecture 21 - Tutorial Problems on SEM

Lecture 22 - Basics of X-ray emission from source, electron excitation and X-ray interaction with materials in general

Lecture 23 - Properties of X-rays

Lecture 24 - Bragg's Law Derivation

Lecture 25 - Diffraction relationship with reciprocal space

Lecture 26 - X-ray scattering

Lecture 27 - Factors affecting intensities of X-ray peaks

Lecture 28 - Factors affecting intensities of X-ray peaks- continuation

Lecture 29 - Effect of crystallite size and strain on intensity of X-rays

Lecture 30 - Profile fit, Factors affecting peak brodening

Lecture 31 - Indexing of diffraction pattern, Quantitative analysis

Lecture 32 - Indexing, Quantitative analysis-continuation, Residual stress measurements

Lecture 33 - XRD and Residual stress measurement- lab demonstration

Lecture 34 - Introduction to Transmission Electron Microscopy (TEM)

Lecture 35 - Fundementals of Transmission Electron Microscopy (TEM)

Lecture 36 - Basics of Diffraction-1

Lecture 37 - Basics of Diffraction-2

Lecture 38 - TEM imaging-1

Lecture 39 - TEM imaging-2

Lecture 40 - TEM instrument demonstration

Lecture 41 - TEM sample preparation-1

Lecture 42 - TEM sample preparation-2

Lecture 43 - XRD Tutorial - 1

Lecture 44 - XRD tutorial - 2

Lecture 45 - TEM Tutorial - 1

Lecture 46 - TEM Tutorial - 2

Lecture 47 - Quantitative metallography - Tutorial 1

Lecture 48 - Quantitative metallography - Tutorial 2

Lecture 49 - Quantitative metallography - Tutorial 3

Lecture 50 - Quantitative metallography - Tutorial 4

Lecture 51 - Quantitative metallography - Tutorial 5

Lecture 52 - Quantitative metallography - Tutorial 6

Lecture 53 - Quantitative metallography - Tutorial 7