NPTEL : NOC:Fundamentals of optical and scanning electron microscopy (Metallurgy and Material Science)

Co-ordinators : Dr. S. Sankaran


Lecture 1 - Properties of light, Image formation

Lecture 2 - Magnification and resolution

Lecture 3 - Depth of field, focus and field of view

Lecture 4 - Lens defects, filters and light microscopy introduction

Lecture 5 - Optical microscope demo., Bright field imaging, opaque specimen illumination

Lecture 6 - Opaque stop microscopy, Phase contrast microscopy

Lecture 7 - Dark field microscopy, Polarization microscopy

Lecture 8 - Differential interference contrast and fluorescence microscopy

Lecture 9 - Sample preparation techniques for optical microscopy

Lecture 10 - Tutorial problems

Lecture 11 - Tutorial problems (Continued...)

Lecture 12 - Introduction to scanning electron Microscopy

Lecture 13 - Lens aberrations, Object resolution, Image quality

Lecture 14 - Interaction between electrons and sample, Imaging capabilities, Structural analysis, Elemental analysis

Lecture 15 - SEM and its mode of operation, Effect of aperture size,Working distance,condenser lens strength

Lecture 16 - SEM and its mode of operation- continuation, Relation between probe current and probe diameter, Summary

Lecture 17 - Factors affecting Interaction volume, Demonstration of SEM

Lecture 18 - Image formation and interpretation

Lecture 19 - Image formation and interpretation continued, EDS, WDS

Lecture 20 - Special contrast mechanisms, Monte Carlo simulations of Interaction volume

Lecture 21 - Electron channeling contrast imaging (ECCI), Electron back scattered diffraction (EBSD)-Theory & instrument demonstration

Lecture 22 - Tutorial Problems on SEM