NPTEL : NOC:Techniques of Material Characterization (Metallurgy and Material Science)

Co-ordinators : Prof. Shibayan Roy


Lecture 1 - Introduction to the course and basic principles of image formation

Lecture 2 - Image formation, resolution, magnification, depth of field and depth of focus

Lecture 3 - Aberrations in microscopy: General concepts

Lecture 4 - Introduction, types and image formation in Optical microscopy

Lecture 5 - Components of optical microscope

Lecture 6 - Bright field and Dark field modes

Lecture 7 - Phase contrast optical microscopy

Lecture 8 - Polarized light microscopy

Lecture 9 - Differential interference contrast

Lecture 10 - Fluorescence microscopy

Lecture 11 - Basic components of electron microscope

Lecture 12 - Basic components of electron microscope (Continued...)

Lecture 13 - Basic components of electron microscope (Continued...)

Lecture 14 - Electron-material interaction

Lecture 15 - Electron-material interaction (Continued...)

Lecture 16 - Electron-material interaction (Continued...) and Image formation and contrast generation

Lecture 17 - Modes of TEM (BF and DF)

Lecture 18 - Modes of TEM

Lecture 19 - Modes of TEM (Continued...) and Electron diffraction in TEM

Lecture 20 - Electron diffraction in TEM

Lecture 21 - Electron diffraction in TEM (Continued...)

Lecture 22 - Electron diffraction in TEM (Continued...)

Lecture 23 - Electron diffraction in TEM (Continued...)

Lecture 24 - Electron diffraction in TEM (Continued...)

Lecture 25 - Application of Electron diffraction

Lecture 26 - Signal generation in SEM

Lecture 27 - Signal generation in SEM (Continued...)

Lecture 28 - Signal generation in SEM (Continued...)

Lecture 29 - Signal generation in SEM (Continued...)

Lecture 30 - Signal generation in SEM (Continued...)

Lecture 31 - Basic components of SEM

Lecture 32 - Basic components of SEM (Continued...)

Lecture 33 - Optics of SEM

Lecture 34 - Optics of SEM (Continued...)

Lecture 35 - Optics of SEM (Continued...) and analytical detectors

Lecture 36 - Analytical detectors in SEM

Lecture 37 - Analytical (WDS) detector and contrast formation in SEM

Lecture 38 - Imaging in SEM

Lecture 39 - Imaging in SEM (Continued...)

Lecture 40 - Imaging in SEM (Continued...)

Lecture 41 - Imaging in SEM and X-ray diffraction

Lecture 42 - Continuous and characteristics X-ray spectrum

Lecture 43 - Characteristics X-ray radiation

Lecture 44 - Characteristics X-ray radiation (Continued...) and X-ray absorption

Lecture 45 - X-ray absorption (Continued...)

Lecture 46 - X-ray absorption and filters

Lecture 47 - Intensity of diffracted beam

Lecture 48 - Intensity of diffracted beam (Continued...)

Lecture 49 - Intensity of diffracted beam (Continued...)

Lecture 50 - Intensity of diffracted beam (Continued...)

Lecture 51 - Intensity of diffracted beam (Continued...)

Lecture 52 - Intensity of diffracted beam (Continued...)

Lecture 53 - Intensity of diffracted beam (Continued...)

Lecture 54 - Intensity of diffracted beam (Continued...)

Lecture 55 - Intensity of diffracted beam (Continued...)

Lecture 56 - Intensity of diffracted beam (Continued...) and X-ray diffraction profile and analysis

Lecture 57 - X-ray diffraction profile and analysis

Lecture 58 - X-ray diffraction profile and analysis (Continued...)

Lecture 59 - X-ray diffraction profile and analysis (Continued...)

Lecture 60 - Electron backscatter diffraction (EBSD)